The fourth generation TRENCH MOS
Process technology
Provide practical solutions based on the needs of different customers.
Productioncapacity
World-class 8-inch production line
The fully automatic production equipment optimizes the process, saving 30% of labor.
Both wafers and packaging are produced by leading domestic manufacturers and manufactured on an 8-inch production line equipped with world-class facilities. Quality is guaranteed through multiple processes, and the entire production process is traceable.
First-class production and testing equipment, and all product materials have passed the RoHS test.
All performance indicators of the product are at the leading level in the industry. The production capacity and scale are strong, and the delivery time is guaranteed.
Ourquality testing
Create high-performance and high-quality EMC protection devices for the electronics industry
Test Item Abrv
Reference
Stress Condition
Sample Size/ Lots
End Point
ESD-HBM
ANSI/ESD STM5.1 AEC-
Q100-002
R=1500Ω,C=100pF,U= Situation imposition (100~20000V) Apply according to the actual situation of the product
Damage after ESD
ESD-MM
ANSI/ESD STM5.1
AECQ100-002
R=0Ω,C=200pF,U=(100~4000V),Apply according to the actual situation of the product
PC
JESD22-A113
Per device Specification Baking-THT(30℃ / 60%RH,
192hours or 60℃ / 60%RH,40hours)→IR(260℃,3cys);
or 125℃ / 24H→THT(85℃ / 85%RH,168hours)→IR(260℃,3cys)
SMD All Parts for TH,TC,UHAST / PCT,H3TRB / HAST
Pre- Electrical Test;
Post- ElectricalTest;
Pre-SAT; PoSt-SAT
HTSL
JESD22-A103
R=1500Ω,C=100pF,U=(100~20000V),Apply according to the actual situation of the product
0,168,500,1000hours
TH
JESD22-A104
Ta=85°C,RH=85%
0,100or200,500,1000cycles
TC
JESD22-A104
Ta =-55°C/15min, to 2~5min, to +150℃ /15min
0,100or200,500,1000cycles
JESD22-A118
JESD22-A104
Ta =130°C; 85%RH
0,96hours
HTRB
JESD22-A108MIL-
STD-750F-1038.5
GBT 4938-1985
Field-effect transistor:Ta=150℃,V=(VDSS Max)*(80%~100%)
Transistor:VR=(80%~100%)*(VDSS Max)*(80%~100%)
Voltage stabilizing diode:VR=VZ Max*(80%~100%)
Thyristor:VR=(VRRM Max)*(80%~100%)
Schottky tube:Ta=85℃,VR=(VRRM Max)*(80%~100%)
0,168,500,1000hours
AC/PCT
JESD22-A102
Ta=121℃, 29.7psig, 100%RH
0,96hours
RSH
JESD22-A 111 (SMD)
JESD22-B 106 (PTH)
SMD:Ta=260°C,10 seconds PTH:Ta=270°C,10 seconds
一
J-STD-002
①PC : Dry Bake 155°C/4hours±15min) Or Dry Bake150°C/16hours±15min)Or Steam 4 Hours±10min
②SMD:Reflow Soldering:Ta=245±5°C,5+0/-0.5 seconds ;
PTH:Wave Soldering : Ta=260°C +5/-0°C,5 +2/-1seconds
一
TS
MIL-STD-750
Method 2036
一
OLT
JESD22-A108
Transistor:Vc=70%VCEO,IC=PC/VC Voltage stabilizing diode:VC=VZ+1V,IC=Iz Three-terminal voltage stabilizing diode:VC=VO+1V,IC≤100mA
0,168 500,1000hours
HTGB
JESD22-A108
Ta=85°C to 150°C,VGS=(VGS Rating)X80%(仅MOS )
0,168 500,1000hours
H3TRB*
JESD22-A101
Ta=85°C RH=85%,VR=(VDS Rating)X80%(Only discrete devices)
0,168 500,1000hours
HAST*
JESD22A-110
Ta=130'C/85%RH,T=96 hours,V=80%VMAX Ta=110°C/85%RH,T=264hrs,V=80%VMAX,The highest is 100V
0,96hours
IOL*
MIL-STD-750 Method 1037
case:Ton=120s,Toff=120s,15000cycles(Only discrete devices)
0,15000hours
| Project | Non-automotive grade 2SC2383T | Automotive grade BR2SC2383TQ | ||||
|---|---|---|---|---|---|---|
Test item |
Minimum value |
Maximum value |
Test conditions |
Minimum value |
Maximum value |
Test conditions |
VCE(SAT) |
50mV |
1.050V |
IC=500mA, IB=50mA |
102.5mV |
132.3mV |
IC=500mA, IB=50mA |
BVCB0 |
165V |
500V |
IC=100uA |
427.8V |
447.8V |
IC=100uA |
BVEB0 |
6.5V |
20V |
IE=100uA |
11.52V |
11.84V |
IE=100uA |
ICB0 |
0 |
80nA |
VCB=150V |
0 |
7.533nA |
VCB=150V |
IEB0 |
0 |
80nA |
VEB=6V |
0 |
10.18nA |
VEB=6V |
BVCE01 |
165V |
400V |
IC=500uA |
204.5V |
231.1V |
IC=500uA |
BVCE02 |
120V |
400V |
IC=15uA |
203.7V |
232.5V |
IC=15uA |
DIVID |
0 |
1.065 |
BVCEO1/BVCEO2 |
0.9912 |
1.006 |
BVCEO1/BVCE02 |
ICE0 |
0 |
2.5uA |
VCE=165V |
128.9nA |
317.6nA |
VCE=165V |
HFE1 |
60 |
320 |
VCE=5V,IC=200mA |
131.3 |
197.8 |
VCE=5V,IC=200mA |
HFE2 |
50 |
320 |
VCE=5V,IC=20mA |
135.7 |
197.6 |
VCE=5V,IC=20mA |
DIVID |
0.73 |
2 |
HFE2/HFE1 |
0.9828 |
1.043 |
HFE2/HFE1 |
VFBC |
650mV |
850mV |
IB=10mA |
745mV |
800mV |
IB=10mA |
VFBE |
650mV |
850mV |
IB=10mA |
744.3mV |
800mV |
IB=10mA |
The testing of automotive-grade products is managed online through PAT. The test data is statistically analyzed to remove products outside the group from the good product specifications
Max static limit = robust mean + 6*(robust sigma)
Min static limit = robust mean - 6*(robust sigma)
Strong scientific research capabilities,Elite team
Professional R&D team
Senior engineer
Professional design team
International standardcertification
All of our production sites have been certified by ISO9001 and ISO/ISO45001.
All policies related to sustainability, health, safety and environmental protection have been integrated into our philosophy, and our production sites have also been certified by ISO14001 and ISO45001.
The products produced also meet environmental protection requirements and comply with EU standards such as RoHS, HF and REACH

