Quality reliability

Quality reliability

Each product is strictly controlled with dozens of parameters to high standards, ensuring more reliable quality

Quality reliability Quality reliability

The fourth generation TRENCH MOS

Process technology

Provide practical solutions based on the needs of different customers.

Reconstruction resistance value of special conductive materials
【ASIM】 It adopts a special conductive layer with low resistance, and the block resistance can reach 22mΩ/mm ². It has a lower resistance than those made by modern processes 40%
The durability of sub-micron slot width reconstruction devices
【ASIM】 The application of sub-micron slot width has reduced the gate leakage capacitance, thereby enhancing the durability of the device20%
Peak power of sub-micron trench reconstruction
【ASIM】 In the unembedded switch power conversion state, it supports pulses up to 0.1ms, with peak power reaching 1KW/㎡P
Density of TRENCH MOS reconfiguration components
【ASIM】 The component density has increased fivefold, achieving 50000万个/ft2

Productioncapacity

World-class 8-inch production line

The fully automatic production equipment optimizes the process, saving 30% of labor.

Both wafers and packaging are produced by leading domestic manufacturers and manufactured on an 8-inch production line equipped with world-class facilities. Quality is guaranteed through multiple processes, and the entire production process is traceable.

First-class production and testing equipment, and all product materials have passed the RoHS test.

All performance indicators of the product are at the leading level in the industry. The production capacity and scale are strong, and the delivery time is guaranteed.

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Ourquality testing

Create high-performance and high-quality EMC protection devices for the electronics industry

Reliability experiment FT Test
Serial number

Test Item Abrv

Reference

Stress Condition

Sample Size/ Lots

Automotive-grade products Non-automotive grade products

End Point

1

ESD-HBM

ANSI/ESD STM5.1 AEC-

Q100-002

R=1500Ω,C=100pF,U= Situation imposition (100~20000V) Apply according to the actual situation of the product

30pcs/1Lot 5pcs/1Lot

Damage after ESD

2

ESD-MM

ANSI/ESD STM5.1

AECQ100-002

R=0Ω,C=200pF,U=(100~4000V),Apply according to the actual situation of the product

30pcs/1Lot 5pcs/1Lot
Damage after ESD
3

PC

JESD22-A113

Per device Specification Baking-THT(30℃ / 60%RH,

192hours or 60℃ / 60%RH,40hours)→IR(260℃,3cys);

or 125℃ / 24H→THT(85℃ / 85%RH,168hours)→IR(260℃,3cys)

SMD All Parts for TH,TC,UHAST / PCT,H3TRB / HAST

Pre- Electrical Test;

Post- ElectricalTest;

Pre-SAT; PoSt-SAT

4

HTSL

JESD22-A103

R=1500Ω,C=100pF,U=(100~20000V),Apply according to the actual situation of the product

77pcs/3Lots 77pcs/1Lot

0,168,500,1000hours

5

TH

JESD22-A104

Ta=85°C,RH=85%

77pcs/3Lots 77pcs/1Lot

0,100or200,500,1000cycles

6

TC

JESD22-A104

Ta =-55°C/15min, to 2~5min, to +150℃ /15min

77pcs/3Lots 77pcs/1Lot

0,100or200,500,1000cycles

7

JESD22-A118

JESD22-A104

Ta =130°C; 85%RH

77pcs/3Lots 77pcs/1Lot

0,96hours

8

HTRB

JESD22-A108MIL-

STD-750F-1038.5

GBT 4938-1985

Field-effect transistor:Ta=150℃,V=(VDSS Max)*(80%~100%)

Transistor:VR=(80%~100%)*(VDSS Max)*(80%~100%)

Voltage stabilizing diode:VR=VZ Max*(80%~100%)

Thyristor:VR=(VRRM Max)*(80%~100%)

Schottky tube:Ta=85℃,VR=(VRRM Max)*(80%~100%)

77pcs/3Lots 77pcs/1Lot

0,168,500,1000hours

9

AC/PCT

JESD22-A102

Ta=121℃, 29.7psig, 100%RH

77pcs/3Lots 77pcs/1Lot

0,96hours

10

RSH

JESD22-A 111 (SMD)

JESD22-B 106 (PTH)

SMD:Ta=260°C,10 seconds PTH:Ta=270°C,10 seconds

77pcs/1Lot 77pcs/1Lot

11
SD

J-STD-002

①PC : Dry Bake 155°C/4hours±15min) Or Dry Bake150°C/16hours±15min)Or Steam 4 Hours±10min

②SMD:Reflow Soldering:Ta=245±5°C,5+0/-0.5 seconds ;

PTH:Wave Soldering : Ta=260°C +5/-0°C,5 +2/-1seconds

10pcs/1Lot 10pcs/1Lot

12

TS

MIL-STD-750

Method 2036

2.5N For TO-92/LM; 5N For TO-220series and TO-126series
30pcs/1Lots 5pcs/1Lot

13

OLT

JESD22-A108

Transistor:Vc=70%VCEO,IC=PC/VC Voltage stabilizing diode:VC=VZ+1V,IC=Iz Three-terminal voltage stabilizing diode:VC=VO+1V,IC≤100mA

77pcs/3Lots 45pcs/1Lot

0,168 500,1000hours

14

HTGB

JESD22-A108

Ta=85°C to 150°C,VGS=(VGS Rating)X80%(仅MOS )

77pcs/3Lots 77pcs/1Lot

0,168 500,1000hours

15

H3TRB*

JESD22-A101

Ta=85°C RH=85%,VR=(VDS Rating)X80%(Only discrete devices)

77pcs/3Lots /

0,168 500,1000hours

16

HAST*

JESD22A-110

Ta=130'C/85%RH,T=96 hours,V=80%VMAX Ta=110°C/85%RH,T=264hrs,V=80%VMAX,The highest is 100V

77pcs/3Lots /

0,96hours

17

IOL*

MIL-STD-750 Method 1037

case:Ton=120s,Toff=120s,15000cycles(Only discrete devices)

77pcs/3Lots /

0,15000hours

Project Non-automotive grade 2SC2383T Automotive grade BR2SC2383TQ

Test item

Minimum value

Maximum value

Test conditions

Minimum value

Maximum value

Test conditions

VCE(SAT)

50mV

1.050V

IC=500mA, IB=50mA

102.5mV

132.3mV

IC=500mA, IB=50mA

BVCB0

165V

500V

IC=100uA

427.8V

447.8V

IC=100uA

BVEB0

6.5V

20V

IE=100uA

11.52V

11.84V

IE=100uA

ICB0

0

80nA

VCB=150V

0

7.533nA

VCB=150V

IEB0

0

80nA

VEB=6V

0

10.18nA

VEB=6V

BVCE01

165V

400V

IC=500uA

204.5V

231.1V

IC=500uA

BVCE02

120V

400V

IC=15uA

203.7V

232.5V

IC=15uA

DIVID

0

1.065

BVCEO1/BVCEO2

0.9912

1.006

BVCEO1/BVCE02

ICE0

0

2.5uA

VCE=165V

128.9nA

317.6nA

VCE=165V

HFE1

60

320

VCE=5V,IC=200mA

131.3

197.8

VCE=5V,IC=200mA

HFE2

50

320

VCE=5V,IC=20mA

135.7

197.6

VCE=5V,IC=20mA

DIVID

0.73

2

HFE2/HFE1

0.9828

1.043

HFE2/HFE1

VFBC

650mV

850mV

IB=10mA

745mV

800mV

IB=10mA

VFBE

650mV

850mV

IB=10mA

744.3mV

800mV

IB=10mA

The testing of automotive-grade products is managed online through PAT. The test data is statistically analyzed to remove products outside the group from the good product specifications

Max static limit = robust mean + 6*(robust sigma)

Min static limit = robust mean - 6*(robust sigma)

Strong scientific research capabilities,Elite team

From solution selection to the mass production of complete machines, ASIM can provide customers with high-quality and efficient services at every stage, effectively shortening the project development cycle, reducing R&D costs, and ensuring mass production performance.
50+(people)

Professional R&D team

10+(people)

Senior engineer

35+(people)

Professional design team

International standardcertification

All of our production sites have been certified by ISO9001 and ISO/ISO45001.

All policies related to sustainability, health, safety and environmental protection have been integrated into our philosophy, and our production sites have also been certified by ISO14001 and ISO45001.

The products produced also meet environmental protection requirements and comply with EU standards such as RoHS, HF and REACH

  • ISO 9001

  • ISO 14001

  • ISO 45001

  • QC 080000

  • An electrostatic suppressor with electrostatic protection function

  • Electronic chip fault detection device

  • Microstrip surface mount filter

  • Heat dissipation devices for electronic components

  • Appearance inspection device for electronic components

  • Unidirectional dual-channel TVS electrostatic protection device

  • TVS tube type high-efficiency electrostatic protection bridge wire type electric detonator

  • High-performance wideband filter

  • High heat dissipation performance microstrip surface mount filter

  • Filter components with protective performance

  • A rapidly assemblable voltage-stabilizing semiconductor diode

  • The packaging module of semiconductor diodes

  • Common mode inductor

  • Integrated filter circuit

  • Integrated MOS architecture

  • Control methods and systems for low-insert transient voltage suppressors

  • Constant transient voltage suppressor control method and system

  • An electrostatic suppressor with electrostatic protection function

  • HF

  • ROHS

  • REACH

Do you need further assistance?

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